Novel bi-polar planar near-field measurement scanner at UCLA

The bipolar near-field measurement technique is described. The optimal sampling interpolation (OSI) is discussed, and numerical examples are presented. The bipolar OSI algorithm was tested via-computer simulation. It is concluded that due to its mechanical simplicity, the measurement technique is expected to be inexpensive to implement while still delivering fast and accurate results. With the derivation of the OSI algorithm, and the minor modification as applied to this case, the bipolar range will be able to make use of the fast Fourier transform algorithm to generate high-resolution far-field and holographic back-projection field values.<>