DocumentCode
2813181
Title
Accelerated test with unknown acceleration model
Author
Lantieri, P. ; Guerin, F. ; Dumon, B.
Author_Institution
Univ. of Angers, France
fYear
2005
fDate
Jan. 24-27, 2005
Firstpage
561
Lastpage
566
Keywords
Weibull distribution; failure analysis; life testing; reliability; stress analysis; Weibull lifetime distribution model; accelerated life testing; accelerated test processing; failure analysis; life time distribution; reliability; step-stress test; stress level; unknown acceleration model; Acceleration; Life estimation; Life testing; Lifetime estimation; Parameter estimation; Predictive models; Sequential analysis; Stress; Transfer functions; Weibull distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN
0149-144X
Print_ISBN
0-7803-8824-0
Type
conf
DOI
10.1109/RAMS.2005.1408422
Filename
1408422
Link To Document