DocumentCode :
2813181
Title :
Accelerated test with unknown acceleration model
Author :
Lantieri, P. ; Guerin, F. ; Dumon, B.
Author_Institution :
Univ. of Angers, France
fYear :
2005
fDate :
Jan. 24-27, 2005
Firstpage :
561
Lastpage :
566
Keywords :
Weibull distribution; failure analysis; life testing; reliability; stress analysis; Weibull lifetime distribution model; accelerated life testing; accelerated test processing; failure analysis; life time distribution; reliability; step-stress test; stress level; unknown acceleration model; Acceleration; Life estimation; Life testing; Lifetime estimation; Parameter estimation; Predictive models; Sequential analysis; Stress; Transfer functions; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN :
0149-144X
Print_ISBN :
0-7803-8824-0
Type :
conf
DOI :
10.1109/RAMS.2005.1408422
Filename :
1408422
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2813181
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