DocumentCode
2813226
Title
Early failure detection system for the SAB80C537 microcontroller
Author
Soto, Enrique ; Marcos, Joao ; Fernandez, S. ; Alvarez, R. ; Barbero, J.
Author_Institution
Dept. of Electron. Technol., Vigo Univ., Spain
fYear
2005
fDate
Jan. 24-27, 2005
Firstpage
572
Lastpage
576
Keywords
environmental testing; failure analysis; fault diagnosis; life testing; microcontrollers; military standards; reliability; stress analysis; Infineon SAB80C527 microcontroller; MIL-STD-883E; accelerated environmental test; accelerated life testing; controller board register; failure detection system; harsh environment; personal computer; reliability; serial port; stress test; Character generation; Circuit testing; Control systems; Life estimation; Microcontrollers; Oscillators; Pulse width modulation; Registers; Signal generators; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
ISSN
0149-144X
Print_ISBN
0-7803-8824-0
Type
conf
DOI
10.1109/RAMS.2005.1408424
Filename
1408424
Link To Document