DocumentCode :
2813227
Title :
Inter-laboratory comparison of reflection and transmission measurements in WR-06 waveguide (110 GHz to 170 GHz)
Author :
Ridler, Nick ; Salter, Martin ; Goy, P. ; Caroopen, Sylvain ; Watts, James ; Clarke, Roland ; Lau, Yuenie ; Linton, David ; Dickie, Raymond ; Huggard, Peter ; Henry, Manju ; Hesler, Jeffrey ; Barker, Scott ; Stan, Jim
Author_Institution :
Nat. Phys. Lab., Teddington, UK
fYear :
2010
fDate :
28-28 May 2010
Firstpage :
1
Lastpage :
10
Abstract :
This paper describes an exercise that was undertaken recently to compare reflection and transmission measurements in rectangular metallic waveguide from 110 GHz to 170 GHz (i.e. in the WR-06 waveguide size). The comparison involved making measurements on four devices fitted with `precision´ MIL-DTL-3922-67D style flanges. These devices were circulated amongst the nine organizations that chose to participate in the exercise. The comparison took place between August 2008 and September 2009. Results from the exercise are presented in graphical form along with a statistical summary showing average variability for the measurements. The authors believe this is the first time that such a comparison of measurements has been made at these frequencies. These results therefore provide a benchmark for the current state-of-the-art for measurements made in waveguide at these frequencies.
Keywords :
millimetre wave measurement; rectangular waveguides; WR-06 waveguide; inter-laboratory comparison; rectangular metallic waveguide; reflection measurements; transmission measurements; Frequency measurement; Laboratories; Measurement standards; Millimeter wave measurements; Millimeter wave technology; Rectangular waveguides; Reflection; Size measurement; Time measurement; Transmission line measurements; Measurement; millimetre-wave measurement; millimetre-wave waveguides; rectangular waveguides; waveguides;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurements Conference (ARFTG), 2010 75th ARFTG
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6364-0
Type :
conf
DOI :
10.1109/ARFTG.2010.5496330
Filename :
5496330
Link To Document :
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