Title :
A comparison of techniques for computing PFD average
Author :
Bukowski, Julia V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Villanova Univ., PA, USA
Keywords :
IEC standards; Markov processes; error analysis; failure analysis; probability; safety; IEC 61508; Markov model; error analysis; failure analysis; probability failed dangerous average; probability techniques; safety instrumented system standard; simplified equation; ANSI standards; Differential equations; Fault trees; IEC standards; Inspection; Instruction sets; Instruments; Phase frequency detector; Probability; Safety;
Conference_Titel :
Reliability and Maintainability Symposium, 2005. Proceedings. Annual
Print_ISBN :
0-7803-8824-0
DOI :
10.1109/RAMS.2005.1408427