• DocumentCode
    2813282
  • Title

    Electrical and optical response of a Mach-Zehnder electrooptical modulator to pulsed irradiation

  • Author

    Hose, C.D. ; Cassan, E. ; Baggie, J. ; Musseau, O. ; Leray, J.L.

  • Author_Institution
    CEA, Centre d´´Etudes de Bruyeres-le-Chatel, France
  • fYear
    1997
  • fDate
    15-19 Sep 1997
  • Firstpage
    392
  • Lastpage
    398
  • Abstract
    Radiation hardness of LiNbO3:Ti Mach-Zehnder optomodulators under high energy electron pulses at high dose rate is studied for the first time. Both electrical and optical measurements are performed at various dose rates and electrical bias conditions. Electrical and optical perturbations are observed to be synchronous of the irradiation pulse, below a total dose threshold of 1 krad(Si). The optical behavior of the various optomodulators under test is related to their structure. As a matter of fact, optical perturbations are due either to photocurrent which superposes to electrical bias, or to an alteration of couplers characteristics
  • Keywords
    Mach-Zehnder interferometers; electro-optical modulation; electron beam effects; lithium compounds; optical waveguide components; radiation hardening (electronics); titanium; 1 krad; LiNbO3:Ti; Mach-Zehnder electrooptical modulator; coupler; dose rate; electrical bias; electrical response; optical response; photocurrent; pulsed electron irradiation; radiation hardness; Electron optics; Electrooptic modulators; Optical attenuators; Optical crosstalk; Optical modulation; Optical pulses; Optical refraction; Optical sensors; Optical variables control; Pulse modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
  • Conference_Location
    Cannes
  • Print_ISBN
    0-7803-4071-X
  • Type

    conf

  • DOI
    10.1109/RADECS.1997.698954
  • Filename
    698954