DocumentCode :
2813282
Title :
Electrical and optical response of a Mach-Zehnder electrooptical modulator to pulsed irradiation
Author :
Hose, C.D. ; Cassan, E. ; Baggie, J. ; Musseau, O. ; Leray, J.L.
Author_Institution :
CEA, Centre d´´Etudes de Bruyeres-le-Chatel, France
fYear :
1997
fDate :
15-19 Sep 1997
Firstpage :
392
Lastpage :
398
Abstract :
Radiation hardness of LiNbO3:Ti Mach-Zehnder optomodulators under high energy electron pulses at high dose rate is studied for the first time. Both electrical and optical measurements are performed at various dose rates and electrical bias conditions. Electrical and optical perturbations are observed to be synchronous of the irradiation pulse, below a total dose threshold of 1 krad(Si). The optical behavior of the various optomodulators under test is related to their structure. As a matter of fact, optical perturbations are due either to photocurrent which superposes to electrical bias, or to an alteration of couplers characteristics
Keywords :
Mach-Zehnder interferometers; electro-optical modulation; electron beam effects; lithium compounds; optical waveguide components; radiation hardening (electronics); titanium; 1 krad; LiNbO3:Ti; Mach-Zehnder electrooptical modulator; coupler; dose rate; electrical bias; electrical response; optical response; photocurrent; pulsed electron irradiation; radiation hardness; Electron optics; Electrooptic modulators; Optical attenuators; Optical crosstalk; Optical modulation; Optical pulses; Optical refraction; Optical sensors; Optical variables control; Pulse modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
Type :
conf
DOI :
10.1109/RADECS.1997.698954
Filename :
698954
Link To Document :
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