Title :
A simplified extension of X-parameters to describe memory effects for wideband modulated signals
Author :
Verspecht, Jan ; Horn, Jason ; Root, David E.
Author_Institution :
Jan Verspecht b.v.b.a., Opwijk, Belgium
Abstract :
An original way is presented to model memory effects of microwave amplifiers in the case of wideband modulated signals. The model is derived as a limiting case of the more general dynamic X-parameter theory. For a given component, the model is identified from pulsed envelope X-parameter measurements performed with an NVNA. The resulting nonlinear X-parameter model is quantitatively described by a 2-variate kernel function that enables the derivation of an optimal static AM-AM AM-PM characteristic for every possible input envelope probability density function. The model is validated by performing a set of 2-tone experiments. The model can be implemented in the ADS circuit envelope simulator.
Keywords :
microwave amplifiers; microwave measurement; modulation; network analysers; ADS circuit envelope simulator; NVNA; X-parameter extension; memory effects; microwave amplifiers; pulsed envelope X-parameter measurements; wideband modulated signals; Frequency measurement; High power amplifiers; Kernel; Microwave amplifiers; Performance evaluation; Probability density function; Pulse amplifiers; Pulse measurements; Steady-state; Wideband; NVNA; X-parameters; behavioral model; frequency domain; measurements; memory effects; pulsed envelope;
Conference_Titel :
Microwave Measurements Conference (ARFTG), 2010 75th ARFTG
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4244-6364-0
DOI :
10.1109/ARFTG.2010.5496334