Fault Detection in NanoICs

Since nanolCs are very noise sensitive and non-reliable in nature, in the logic design of nanolCs, a fault detection method must be included as an essential requirement in the design and manufacturing process to ensure that the nanolC will function normally as expected. The logic design model of the nanolC used in this paper is the N-hypercube.The fault types considered are transition faults occurring at terminal nodes of the N-hypercube: 0*1 and 1*0, denoted by f0*1 and f1*0, respectively. This paper presents a fault detection method using the Boolean difference, which can not only derive tests for testing the above mentioned transition faults at any terminal node of the hypercube but also generate a complete minimum test set for detecting any f0*1 and f1*0 faults in the nanolC. An example is given to illustrate the method.