• DocumentCode
    2813578
  • Title

    Critical parameters for reliable surface mounting of high pincount packages

  • Author

    Euzent, Bruce L. ; Kawanami, Bruce K. ; Lau, Sam

  • Author_Institution
    Altera Corp., San Jose, CA, USA
  • fYear
    1998
  • fDate
    March 31 1998-April 2 1998
  • Firstpage
    220
  • Lastpage
    224
  • Abstract
    There have been numerous studies of delamination induced failures after reflow soldering of surface mount devices. However, most of these studies have concentrated on packages with less than 100 pins with die smaller than 100 mm/sup 2/. In this paper, we examine the failure mechanism associated with larger die in plastic quad flatpacks (PQFPs) and thermally enhanced PQFPs with up to 304 pins and die area up to 212 mm/sup 2/. The degradation in performance with increased reflow soldering temperature and absorbed moisture is characterized, and techniques to improve performance in reflow soldering from both the integrated circuit and printed circuit board perspective are discussed.
  • Keywords
    assembling; circuit reliability; delamination; failure analysis; moisture; plastic packaging; printed circuit manufacture; reflow soldering; surface mount technology; PQFPs; absorbed moisture; delamination induced failure; die size; failure mechanism; integrated circuit; package pin count; plastic quad flatpacks; printed circuit board; reflow soldering; reflow soldering temperature; reliable surface mounting; surface mount devices; thermally enhanced PQFPs; Delamination; Failure analysis; Moisture; Packaging; Pins; Plastics; Printed circuits; Reflow soldering; Temperature; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International
  • Conference_Location
    Reno, NV, USA
  • Print_ISBN
    0-7803-4400-6
  • Type

    conf

  • DOI
    10.1109/RELPHY.1998.670554
  • Filename
    670554