DocumentCode
2813578
Title
Critical parameters for reliable surface mounting of high pincount packages
Author
Euzent, Bruce L. ; Kawanami, Bruce K. ; Lau, Sam
Author_Institution
Altera Corp., San Jose, CA, USA
fYear
1998
fDate
March 31 1998-April 2 1998
Firstpage
220
Lastpage
224
Abstract
There have been numerous studies of delamination induced failures after reflow soldering of surface mount devices. However, most of these studies have concentrated on packages with less than 100 pins with die smaller than 100 mm/sup 2/. In this paper, we examine the failure mechanism associated with larger die in plastic quad flatpacks (PQFPs) and thermally enhanced PQFPs with up to 304 pins and die area up to 212 mm/sup 2/. The degradation in performance with increased reflow soldering temperature and absorbed moisture is characterized, and techniques to improve performance in reflow soldering from both the integrated circuit and printed circuit board perspective are discussed.
Keywords
assembling; circuit reliability; delamination; failure analysis; moisture; plastic packaging; printed circuit manufacture; reflow soldering; surface mount technology; PQFPs; absorbed moisture; delamination induced failure; die size; failure mechanism; integrated circuit; package pin count; plastic quad flatpacks; printed circuit board; reflow soldering; reflow soldering temperature; reliable surface mounting; surface mount devices; thermally enhanced PQFPs; Delamination; Failure analysis; Moisture; Packaging; Pins; Plastics; Printed circuits; Reflow soldering; Temperature; Thermal degradation;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International
Conference_Location
Reno, NV, USA
Print_ISBN
0-7803-4400-6
Type
conf
DOI
10.1109/RELPHY.1998.670554
Filename
670554
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