Title :
Critical parameters for reliable surface mounting of high pincount packages
Author :
Euzent, Bruce L. ; Kawanami, Bruce K. ; Lau, Sam
Author_Institution :
Altera Corp., San Jose, CA, USA
fDate :
March 31 1998-April 2 1998
Abstract :
There have been numerous studies of delamination induced failures after reflow soldering of surface mount devices. However, most of these studies have concentrated on packages with less than 100 pins with die smaller than 100 mm/sup 2/. In this paper, we examine the failure mechanism associated with larger die in plastic quad flatpacks (PQFPs) and thermally enhanced PQFPs with up to 304 pins and die area up to 212 mm/sup 2/. The degradation in performance with increased reflow soldering temperature and absorbed moisture is characterized, and techniques to improve performance in reflow soldering from both the integrated circuit and printed circuit board perspective are discussed.
Keywords :
assembling; circuit reliability; delamination; failure analysis; moisture; plastic packaging; printed circuit manufacture; reflow soldering; surface mount technology; PQFPs; absorbed moisture; delamination induced failure; die size; failure mechanism; integrated circuit; package pin count; plastic quad flatpacks; printed circuit board; reflow soldering; reflow soldering temperature; reliable surface mounting; surface mount devices; thermally enhanced PQFPs; Delamination; Failure analysis; Moisture; Packaging; Pins; Plastics; Printed circuits; Reflow soldering; Temperature; Thermal degradation;
Conference_Titel :
Reliability Physics Symposium Proceedings, 1998. 36th Annual. 1998 IEEE International
Conference_Location :
Reno, NV, USA
Print_ISBN :
0-7803-4400-6
DOI :
10.1109/RELPHY.1998.670554