Elevated temperature measurements of permittivity and permeability at temperatures above 1000 degrees C

Author

Friederich, P. ; Moore, R.L. ; Larsen, J.W.

Author_Institution

Georgia Tech Res. Inst., Atlanta, GA, USA

fYear

1991

fDate

24-28 June 1991

Firstpage

1672

Abstract

A system to measure complex electromagnetic constitutive parameters to temperatures of 2000 degrees C has been successfully designed and constructed. The facility is based on a reflectometer measurement using a Hewlett Packard 8510B as a receiver and a circular graphite transmission line. A calibration short (external to the heated transmission line) is to improve calibration of the reflection coefficient. Parameters can be measured from 7.5 to 40 GHz. The authors present a design of the system and a discussion of the measurement procedure used to obtain the high-temperature data. Measurements of commercial ceramics are presented for comparison to other techniques.<>

Keywords

alumina; calibration; ceramics; dielectric measurement; dielectric properties of solids; high-temperature techniques; microwave reflectometry; permittivity measurement; reflectometers; 23 to 2000 degC; 7.5 to 40 GHz; Al/sub 2/O/sub 3/; EHF; Hewlett Packard 8510B receiver; SHF; calibration; ceramics; complex electromagnetic constitutive parameters; elevated temperature measurements; measurement system design; permeability; permittivity; reflection coefficient; reflectometer measurement; Dielectric measurements; Electromagnetic measurements; Frequency measurement; Permeability measurement; Permittivity measurement; Plasma temperature; Power transmission lines; Reflection; Temperature measurement; Transmission line measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1991. AP-S. Digest

Conference_Location

London, Ontario, Canada

Print_ISBN

0-7803-0144-7

Type

conf

DOI

10.1109/APS.1991.175178

Filename

175178