• DocumentCode
    2814097
  • Title

    Comparison and Analysis of the Development in Grading Subjective Tests Algorithms

  • Author

    Wei, Wei ; Yanchun, Zhao

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Hebei Univ. of Technol., Tianjin, China
  • fYear
    2009
  • fDate
    1-3 Nov. 2009
  • Firstpage
    494
  • Lastpage
    497
  • Abstract
    The automatic technology of grading subjective tests is a key issue in network examination. Based on the research of automatic grading subjective tests, this paper elaborates the basic ideas of various algorithms, analyses the advantages and disadvantages. At last, it gives a brief explanation of the problem faced and uses its development for reference.
  • Keywords
    data mining; pattern recognition; automatic technology; data mining; grading subjective tests algorithms; network examination; pattern recognition; Algorithm design and analysis; Artificial intelligence; Automatic testing; Calculus; Data mining; Intelligent networks; Intelligent systems; Natural languages; Pattern recognition; System testing; automatic grading; sematic; similarity; subjective tests;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Networks and Intelligent Systems, 2009. ICINIS '09. Second International Conference on
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4244-5557-7
  • Electronic_ISBN
    978-0-7695-3852-5
  • Type

    conf

  • DOI
    10.1109/ICINIS.2009.132
  • Filename
    5363177
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2814097