Automatic system of measuring dispersion and interaction impedance of Helix SWS

Author

Liang, Youhuan ; Li, Zhenyuan ; Feng, Jinjun ; Zhao, Shilu ; Yan, Tiechang

Author_Institution

Vacuum Electron. Nat. Lab., Beijing Vacuum Electron. Res. Inst., Beijing, China

fYear

2009

fDate

28-30 April 2009

Firstpage

435

Lastpage

436

Abstract

In order to obtain the parameters of dispersion and interaction impedance of helix slow-wave structure (SWS), an automatic system was established. A non-resonant perturbation model was employed in the system. The helix SWS under measurement is 1:1 model of practical helix SWS. The hardware of the system is mainly composed of Vector Network Analyzer (VNA), personal computer (PC), moving platform, controller and optical monitor. The special program was developed to control the measure progress and manage the data. The experimental results were in good agreement with the results calculated using Microwave Studio.

Keywords

dispersion (wave); electric impedance measurement; electronic engineering computing; slow wave structures; Microwave Studio; dispersion measurement; helix SWS; helix slow-wave structure; interaction impedance; nonresonant perturbation model; Automatic control; Dispersion; Frequency measurement; Hardware; Impedance measurement; Optical control; Probes; Propagation constant; Vacuum systems; Wire; automatic measure; dispersion; helix SWS; interaction impedance; non-resonant perturbation;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference, 2009. IVEC '09. IEEE International

Conference_Location

Rome

Print_ISBN

978-1-4244-3500-5

Electronic_ISBN

978-1-4244-3501-2

Type

conf

DOI

10.1109/IVELEC.2009.5193557

Filename

5193557