• DocumentCode
    2814223
  • Title

    Efficient checker processor design

  • Author

    Chatterjee, Saugata ; Weaver, Chris ; Austin, Todd

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., MI, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    87
  • Lastpage
    97
  • Abstract
    The design and implementation of a modern microprocessor creates many reliability challenges. Designers must verify the correctness of large complex systems and construct implementations that work reliably in varied (and occasionally adverse) operating conditions. In our previous work, we proposed a solution to these problems by adding a simple, easily verifiable checker processor at pipeline retirement. Performance analyses of our initial design were promising, overall slowdowns due to checker processor hazards were less than 3%. However slowdowns for some outlier programs were larger. The authors closely examine the operation of the checker processor. We identify the specific reasons why the initial design works well for some programs, but slows others. Our analyses suggest a variety of improvements to the checker processor storage system. Through the addition of a 4 k checker cache and eight entry store queue, our optimized design eliminates virtually all core processor slowdowns. Moreover, we develop insights into why the optimized checker processor performs well, insights that suggest it should perform well for any program
  • Keywords
    cache storage; design engineering; formal verification; microprocessor chips; pipeline processing; checker processor design; checker processor hazards; checker processor storage system; correctness; large complex systems; modern microprocessor; optimized checker processor; optimized design; outlier programs; performance analyses; pipeline retirement; processor slowdowns; reliability challenges; store queue; verifiable checker processor; Design optimization; Formal verification; Hazards; Microprocessors; Performance analysis; Pipelines; Process design; Retirement; Space technology; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microarchitecture, 2000. MICRO-33. Proceedings. 33rd Annual IEEE/ACM International Symposium on
  • Conference_Location
    Monterey, CA
  • ISSN
    1072-4451
  • Print_ISBN
    0-7695-0924-X
  • Type

    conf

  • DOI
    10.1109/MICRO.2000.898061
  • Filename
    898061