DocumentCode
2814443
Title
Measurement of the coupling impedance in slow-wave structures using a longitudinally conducting plate
Author
Pchelnikov, Yuriy N. ; Larsen, Paul
Author_Institution
SAIC, Cary, NC, USA
fYear
2009
fDate
28-30 April 2009
Firstpage
461
Lastpage
462
Abstract
A method of measuring the coupling impedance in slow-wave structures (SWS) is presented and analyzed in this paper. This method is based on comparisons of the resonant frequencies of a SWS with and without the longitudinally conducting probe. Using these frequencies, we derive an expression for the wave impedance of a sheet electron beam in a planar SWS with a rectangular cross section.
Keywords
electron beams; slow wave structures; coupling impedance; longitudinally conducting plate; resonant frequencies; sheet electron beam; slow wave structures; Capacitance measurement; Conductors; Electron beams; Impedance measurement; Laboratories; Optical coupling; Permeability; Permittivity; Resonant frequency; Surface impedance; coupling impedance; sheet electron beam; slow-wave structure;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference, 2009. IVEC '09. IEEE International
Conference_Location
Rome
Print_ISBN
978-1-4244-3500-5
Electronic_ISBN
978-1-4244-3501-2
Type
conf
DOI
10.1109/IVELEC.2009.5193570
Filename
5193570
Link To Document