Research on thermal-electron-emission area source for low-light image intensifier screen testing instrument

Thermal-electron emission area source is a key component in image intensifier screen testing instrument. On the basis of the analysis of relationship between thermal emission characteristics, the shape of filament and the density of thermal electron emission, electronic area-emitting source is designed. The distribution of electric field and electronic tracks are theoretically analyzed and calculated to make it has features of dispersing, uniform, converging and submerging. By testing a standard screen, correct the structure of thermal electron area sources to meet the requirements of test indexes and obtain reasonable thermal electron emission area sources. Its successful development provides effective technical support to the luminous screen test for uniformity, brightness, luminescence efficiency and afterglow and to the examination of other components (such as MCP parameters)of low-light image intensifier.