Title :
EM Methods for Full-Wave Characterization of Microwave Integrated Circuits
Author :
Yagoub, Mustapha C E ; Tounsi, Mohamed L. ; Vuong, Tân-Phy
Author_Institution :
Univ. of Ottawa, Ottawa
Abstract :
Higher integration and smaller layout size, two major trends in today´s radio frequency and microwave industry, lead to more prominent electromagnetic high order effects. In this paper, the authors present a survey of existing electromagnetic techniques used to compute such effects in microwave integrated circuits, highlighting their specific advantages/disadvantages for a circuit designer.
Keywords :
computational electromagnetics; integrated circuit design; integrated circuit modelling; microwave integrated circuits; electromagnetic high order effects; electromagnetic techniques; full-wave microwave integrated circuit characterization; passive structures; Electromagnetic scattering; Impedance; Integral equations; Microwave devices; Microwave integrated circuits; Microwave technology; Microwave theory and techniques; Planar transmission lines; Radio frequency; Transmission line theory;
Conference_Titel :
Electrical and Computer Engineering, 2007. CCECE 2007. Canadian Conference on
Conference_Location :
Vancouver, BC
Print_ISBN :
1-4244-1020-7
Electronic_ISBN :
0840-7789
DOI :
10.1109/CCECE.2007.419
