Title :
Research of accelerated degradation test on server
Author :
Zhang, Xiaojie ; Jiang, Tongmin ; Li, Zheng
Author_Institution :
Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
Reliability is considered the core issues in face of server product at present; accelerated degradation testing is the significant method to assess the reliability & life of server. In this paper, after the stress analysis of operation & storage conditions for A950r-F server, accelerated degradation model based on uniform design are proposed, the testing design guideline are given. A series of accelerated degradation testing are implemented, and the application of test program & model validate the usability & effect.
Keywords :
network servers; reliability; stress analysis; A950r-F server; accelerated degradation test; failure analysis; reliability; storage conditions; stress analysis; Degradation; Electromagnetics; Humidity; Life estimation; Presses; Reliability; Testing; Failure Analysis; accelerated degradation testing; life design; reliability; server;
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
DOI :
10.1109/ICCASM.2010.5619369
