DocumentCode
2815355
Title
Research of accelerated degradation test on server
Author
Zhang, Xiaojie ; Jiang, Tongmin ; Li, Zheng
Author_Institution
Sch. of Reliability & Syst. Eng., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Volume
1
fYear
2010
fDate
22-24 Oct. 2010
Abstract
Reliability is considered the core issues in face of server product at present; accelerated degradation testing is the significant method to assess the reliability & life of server. In this paper, after the stress analysis of operation & storage conditions for A950r-F server, accelerated degradation model based on uniform design are proposed, the testing design guideline are given. A series of accelerated degradation testing are implemented, and the application of test program & model validate the usability & effect.
Keywords
network servers; reliability; stress analysis; A950r-F server; accelerated degradation test; failure analysis; reliability; storage conditions; stress analysis; Degradation; Electromagnetics; Humidity; Life estimation; Presses; Reliability; Testing; Failure Analysis; accelerated degradation testing; life design; reliability; server;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location
Taiyuan
Print_ISBN
978-1-4244-7235-2
Electronic_ISBN
978-1-4244-7237-6
Type
conf
DOI
10.1109/ICCASM.2010.5619369
Filename
5619369
Link To Document