• DocumentCode
    2815401
  • Title

    A fast circuit model for interaction of open-ended rectangular waveguide probes with surface long cracks in metals

  • Author

    Ahanian, I. ; Sadeghi, S.H.H. ; Moini, R.

  • Author_Institution
    Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
  • fYear
    2011
  • fDate
    22-24 Feb. 2011
  • Firstpage
    57
  • Lastpage
    59
  • Abstract
    This paper proposes a modeling technique that predicts the output signal of an open-ended rectangular waveguide probe when scanning a long crack. The technique is based on a circuit approximation model and hence remarkably reduces the computation burden. In this model, the waveguide probe is replaced with a transmission line, the crack is replaced with a shorted transmission line, and the interface between the probe and the crack is replaced with an appropriate impedance. The validity of the proposed model is demonstrated by comparing the simulation results of several case studies with those obtained using a commercial finite integration technique code.
  • Keywords
    fatigue cracks; metals; rectangular waveguides; surface cracks; circuit approximation model; commercial finite integration technique code; fast circuit model; impedance; metals; open-ended rectangular waveguide probes; surface long cracks; transmission line; Computational modeling; Integrated circuit modeling; Power transmission lines; Probes; Rectangular waveguides; Surface cracks; Surface impedance; Circuit model; Nondestructive evaluation; Surface crack; Waveguide probe;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors Applications Symposium (SAS), 2011 IEEE
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    978-1-4244-8063-0
  • Type

    conf

  • DOI
    10.1109/SAS.2011.5739824
  • Filename
    5739824