DocumentCode
2815401
Title
A fast circuit model for interaction of open-ended rectangular waveguide probes with surface long cracks in metals
Author
Ahanian, I. ; Sadeghi, S.H.H. ; Moini, R.
Author_Institution
Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
fYear
2011
fDate
22-24 Feb. 2011
Firstpage
57
Lastpage
59
Abstract
This paper proposes a modeling technique that predicts the output signal of an open-ended rectangular waveguide probe when scanning a long crack. The technique is based on a circuit approximation model and hence remarkably reduces the computation burden. In this model, the waveguide probe is replaced with a transmission line, the crack is replaced with a shorted transmission line, and the interface between the probe and the crack is replaced with an appropriate impedance. The validity of the proposed model is demonstrated by comparing the simulation results of several case studies with those obtained using a commercial finite integration technique code.
Keywords
fatigue cracks; metals; rectangular waveguides; surface cracks; circuit approximation model; commercial finite integration technique code; fast circuit model; impedance; metals; open-ended rectangular waveguide probes; surface long cracks; transmission line; Computational modeling; Integrated circuit modeling; Power transmission lines; Probes; Rectangular waveguides; Surface cracks; Surface impedance; Circuit model; Nondestructive evaluation; Surface crack; Waveguide probe;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors Applications Symposium (SAS), 2011 IEEE
Conference_Location
San Antonio, TX
Print_ISBN
978-1-4244-8063-0
Type
conf
DOI
10.1109/SAS.2011.5739824
Filename
5739824
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