DocumentCode :
2815535
Title :
Low frequency characterization of partially filled gratings-TE case
Author :
Barkeshli, K.
Author_Institution :
Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
Volume :
1
fYear :
1996
fDate :
21-26 July 1996
Firstpage :
497
Abstract :
We derive analytical expressions for various fundamental parameters of an electrically narrow rectangular grating. These include tangential electric field over the aperture, equivalent admittance, aperture voltage and the reflection coefficient for the dominant Floquet mode. The grooves are assumed to be partially (or completely) filled with a lossy material. The loading material is simulated by applying the standard impedance boundary condition.
Keywords :
diffraction gratings; electric admittance; electric fields; electric impedance; electromagnetic wave reflection; electromagnetic wave scattering; waveguide theory; TE waves; analytical expressions; aperture; aperture voltage; current density distribution; dominant Floquet mode; electrically narrow rectangular grating; equivalent admittance; full wave integral equation; impedance boundary condition; loading material; lossy material; low frequency characterization; magnetic current density; parameters; partially filled gratings; periodic grooves; reflection coefficient; resistive strip gratings; scattering characteristics; tangential electric field; Admittance; Apertures; Boundary conditions; Computer aided software engineering; Dielectric materials; Frequency; Gratings; Reflection; Strips; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1996. AP-S. Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-3216-4
Type :
conf
DOI :
10.1109/APS.1996.549646
Filename :
549646
Link To Document :
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