Title :
Adaptive KPCA-based missing texture reconstruction approach including classification scheme via difference subspaces
Author :
Ogawa, Takahiro ; Haseyama, Miki
Author_Institution :
Grad. Sch. of Inf. Sci. & Technol., Hokkaido Univ., Sapporo, Japan
Abstract :
This paper presents an adaptive kernel principal component analysis (KPCA) based missing texture reconstruction approach including a classification scheme via difference subspaces. The proposed method utilizes a KPCA-based nonlinear eigenspace, which is obtained from each kind of known texture within a target image, as a constraint for reconstructing missing textures with a constraint of known neighboring areas. Then since these two constraints are convex, we can estimate missing textures based on a projection onto convex sets (POCS) algorithm. Furthermore, in this approach, the proposed method derives a new criterion for selecting the optimal eigenspace by monitoring errors caused in the projection via a difference subspace of each kind of known texture. This provides a solution to conventional problems of not being able to perform accurate texture classification, and the adaptive reconstruction of missing textures can be realized by the proposed method. Experimental results show subjective and quantitative improvement of the proposed method over previously reported reconstruction methods.
Keywords :
eigenvalues and eigenfunctions; image classification; image reconstruction; image texture; principal component analysis; set theory; KPCA-based nonlinear eigenspace; POCS; adaptive KPCA-based missing texture reconstruction; classification scheme; difference subspaces; image restoration; kernel principal component analysis; optimal eigenspace selection; projection-onto-convex sets algorithm; texture classification; Approximation methods; Conferences; Image reconstruction; Image restoration; Reconstruction algorithms; Vectors; Image restoration; KPCA; POCS; difference subspace; image texture analysis;
Conference_Titel :
Image Processing (ICIP), 2011 18th IEEE International Conference on
Conference_Location :
Brussels
Print_ISBN :
978-1-4577-1304-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2011.6115627