A high speed production die sort system for high gain MMIC receivers

Author

Dammann, C.A. ; Wallave, P.W. ; Miller, D.F. ; Bayruns, R.J.

Author_Institution

Anadigics Inc., Warren, NJ, USA

fYear

1990

fDate

7-10 Oct. 1990

Firstpage

81

Lastpage

84

Abstract

A high-speed production die sort system developed for wafer probing of 12 GHz high-gain MMIC (monolithic microwave IC) receivers is described. The purpose of the system is to reduce manufacturing costs and increase throughput by eliminating noncompliant die early in the manufacturing process. Another important function of the system is to automatically provide process and design information which can be used for yield enhancement through design and process improvements. Over the course of production of the MMIC receiver, yields have more than doubled, largely as a result of the die sort data that has been fed back to the engineering and manufacturing departments. The test time is reduced to three seconds per die, without sacrificing the accuracy of the measurement.<>

Keywords

MMIC; automatic test equipment; field effect integrated circuits; inspection; integrated circuit manufacture; integrated circuit testing; production testing; radio receivers; 12 GHz; die sort data; high gain MMIC receivers; high speed production die sort system; monolithic microwave IC; process improvements; test time; wafer probing; yield enhancement; Costs; Data engineering; High speed integrated circuits; MMICs; Manufacturing processes; Microwave integrated circuits; Monolithic integrated circuits; Process design; Production systems; Throughput;

fLanguage

English

Publisher

ieee

Conference_Titel

Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual

Conference_Location

New Orleans, LA, USA

Type

conf

DOI

10.1109/GAAS.1990.175454

Filename

175454