DocumentCode :
2816046
Title :
The analysis of high frequency vibrations of layered anisotropic plates for FBAR applications
Author :
Huang, Dejin ; Wang, Ji ; Du, Jianke
Author_Institution :
Sch. of Eng., Ningbo Univ., Ningbo
fYear :
2008
fDate :
19-21 May 2008
Firstpage :
204
Lastpage :
208
Abstract :
In this paper, the thickness-extension vibration of a layered piezoelectric plate is investigated. The vibration deformation consists of symmetric and asymmetric deformation. Thicknesses of the adhered layers will influence the frequency of the plate and the amplitude ratio between the layers significantly.
Keywords :
acoustic resonators; anisotropic media; bulk acoustic wave devices; deformation; inhomogeneous media; piezoelectric materials; plates (structures); vibrations; asymmetric deformation; film bulk acoustic wave resonators; high frequency vibrations; layered anisotropic plates; layered piezoelectric plate; symmetric deformation; thickness-extension vibration; vibration deformation; Acoustic waves; Anisotropic magnetoresistance; Equations; Film bulk acoustic resonators; Frequency; Piezoelectric devices; Piezoelectric films; Stress; Substrates; Thin film devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 2008 IEEE International
Conference_Location :
Honolulu, HI
ISSN :
1075-6787
Print_ISBN :
978-1-4244-1794-0
Electronic_ISBN :
1075-6787
Type :
conf
DOI :
10.1109/FREQ.2008.4622990
Filename :
4622990
Link To Document :
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