• DocumentCode
    2816475
  • Title

    A novel FET structure of buried plated heat sink for superior high performance GaAs MMICs

  • Author

    Okaniwa, K. ; Ishikawa, T. ; Kosaki, K. ; Komaru, M. ; Notani, Y. ; Kobiki, M. ; Mitsui, Y. ; Orisaka, S. ; Nishitani, K.

  • Author_Institution
    Mitsubishi Electric Corp., Hyogo, Japan
  • fYear
    1990
  • fDate
    7-10 Oct. 1990
  • Firstpage
    233
  • Lastpage
    236
  • Abstract
    A novel FET structure with buried plate heat sink is proposed which gives higher power output and power added efficiency with easy wafer and chip handling. The substrate thickness is extremely thin (30 mu m) with a 70- mu m-thick gold-plated heat sink for the FET region, and it is 100- mu m for the remaining part of the chip. The buried plated heat sink FET with a gate width of 350 mu m provides a superior low thermal resistance of 16 degrees C/W, a power output as high as 27.9 dBm with an excellent power added efficiency of 32% at 1-dB compression point, and a linear power gain of 8.3 dB at 18 GHz. The fabrication technique, the structural reliability, the thermal resistance, and the RF performances of the newly developed FETs are presented.<>
  • Keywords
    III-V semiconductors; MMIC; circuit reliability; field effect integrated circuits; gallium arsenide; heat sinks; 18 GHz; 30 micron; 32 percent; 350 micron; 8.3 dB; Au plating; FET structure; GaAs; MMICs; RF performances; SHF; buried plated heat sink; fabrication technique; monolithic microwave IC; structural reliability; substrate thickness; thermal resistance; Electrodes; Etching; Gallium arsenide; Gold; Heat sinks; Inductance; MMICs; Microstrip; Microwave FETs; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual
  • Conference_Location
    New Orleans, LA, USA
  • Type

    conf

  • DOI
    10.1109/GAAS.1990.175495
  • Filename
    175495