All optical characterization of MMICs

Author

Riaziat, M. ; Weingarten, K. ; Generali, L. ; Gerstenberger, D. ; Drobshoff, A. ; Ching, L.Y.

Author_Institution

Varian Res. Center, Palo Alto, CA, USA

fYear

1990

fDate

7-10 Oct. 1990

Firstpage

347

Lastpage

351

Abstract

Microwave, frequency-domain measurements using optical beams to both deliver the excitation and measure the circuit response are demonstrated on monolithic microwave integrated circuits (MMICs). A modulated diode laser delivers the microwave excitation up to 10 GHz to an integrated MSM (metal semiconductor metal) photodetector driving a MMIC amplifier. The circuit´s small-signal response is measured with another laser using electrooptic (EO) sampling. Excitation at frequencies above 10 GHz is demonstrated using the output of two frequency-doubled single frequency lasers mixed together to produce a microwave beat signal.<>

Keywords

MMIC; frequency-domain analysis; integrated circuit testing; measurement by laser beam; microwave amplifiers; MMICs; MSM photodetector; electro-optic sampling; frequency-domain measurements; frequency-doubled single frequency lasers; microwave beat signal; modulated diode laser; monolithic microwave integrated circuits; small-signal response; Frequency measurement; Integrated circuit measurements; Laser excitation; Lasers and electrooptics; MMICs; Masers; Microwave measurements; Optical modulation; Semiconductor lasers; Semiconductor optical amplifiers;

fLanguage

English

Publisher

ieee

Conference_Titel

Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual

Conference_Location

New Orleans, LA, USA

Type

conf

DOI

10.1109/GAAS.1990.175526

Filename

175526