DocumentCode
2816986
Title
Equivalent phase comparison frequency and its characteristics
Author
Wei Zhou ; Hui Zhou ; Fan, Wenjing ; Wang, Hai ; Qian, Shixiang ; Jiang, Weining
Author_Institution
Dept. of Meas. & Instrum., Xidian Univ., Xian
fYear
2008
fDate
19-21 May 2008
Firstpage
468
Lastpage
470
Abstract
Equivalent phase comparison frequency (EPCF) is an important parameter between two frequency signals, and it shows their phase correlation. It is much higher than anyone of the two frequencies, and its period is equal to the group phase shift corresponding two most adjacent phase coincidences between the signals. For example, to two frequency signals with several MHz frequency, their EPCF can be several GHz or higher. This concept is based on time or phase analysis and processing approaches, not those of frequency. With it to process time and frequency signals much higher phase processing resolution can be obtained. It is special effective for showing the phase correlation of signals that have different frequencies. The characteristics of phase changes between two different signals were usually showed by relative changes of periodic group phase generated by least common multiple period. EPCF is also the higher resolution reflection of the relative phase and frequency correlation between two signals. Thus, the concept based on EPCF can be used in measurement, processing, control of time and frequency signals, and develop a lot of new techniques and instruments.
Keywords
correlation methods; frequency measurement; frequency synthesizers; phase measurement; signal resolution; time measurement; EPCF; equivalent phase comparison frequency; frequency generator; frequency signal; group phase shift; phase correlation; phase processing resolution; time signal measurement; Character generation; Frequency measurement; Instruments; Phase measurement; Process control; Reflection; Signal generators; Signal processing; Signal resolution; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 2008 IEEE International
Conference_Location
Honolulu, HI
ISSN
1075-6787
Print_ISBN
978-1-4244-1794-0
Electronic_ISBN
1075-6787
Type
conf
DOI
10.1109/FREQ.2008.4623042
Filename
4623042
Link To Document