Title :
Simulation of the Corrosion Caused by Water Soluble Salt in Dust
Author_Institution :
Res. Lab. of Electr. Contact, BUPT, Beijing, China
Abstract :
Dust may cause corrosion in humid environment. Investigation of water solution of dust collected from Beijing and Shanghai showed that SO4-2 and Cl-1 were the major negative ions and Na+1, K+1, Ca+2 dominated the positive ions. Obvious corrosion was formed on the coupon surface when such solution was dropped on. Artificial particles including NaCl, Na2SO4 and CaSO4 are selected to simulate dust corrosion in laboratory. Solution of NaCl particles can cause serious corrosion on copper and gold plated coupon. However, the corrosion formed by Na2SO4 and CaSO4 solution is too slight to be observed. The result is mainly affected by characteristics of negative ions in salt solution, as well as relative humidity and temperature. The characteristic factors include penetration, adsorption, solubility, and acidity of ions. An effective method to reproduce corrosion found on failed contacts in laboratory setup would be spraying NaCl solution with limited concentration on SiO2 particles spread on coupon surface, thus producing SiO2 particles surrounded with NaCl. It is shown that NaCl with 2.5% concentration would be the effective method from repeated experiments. It takes tenths or even hundreds of fretting cycles to push SiO2 particles surrounded with corrosion product away. The number decreases to only several cycles for the particles without surrounded by corrosion products. It can be deduced that trapping effect of corrosion product on SiO2 particles is not neglected, and particle corrosion should be included in laboratory simulation of dust particles.
Keywords :
contact resistance; corrosion; dust; electrical contacts; negative ions; positive ions; silicon compounds; SiO2; artificial particles; contact resistance; corrosion simulation; coupon surface; dust particles; gold plated coupon; negative ions; positive ions; relative humidity; trapping effect; water soluble salt; Contacts; Copper; Corrosion; Heating; Ions; Laboratories; Surface morphology;
Conference_Titel :
Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
Conference_Location :
Charleston, SC
Print_ISBN :
978-1-4244-8174-3
DOI :
10.1109/HOLM.2010.5619470