• DocumentCode
    2817394
  • Title

    Single Event Upset Characterization of the Virtex-5 Field Programmable Gate Array Using Proton Irradiation

  • Author

    Hiemstra, David M. ; Battiston, George ; Gill, Prab

  • Author_Institution
    MDA, Brampton, ON, Canada
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    4
  • Lastpage
    4
  • Abstract
    Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Virtex-5 FPGA are presented. Upset rates in the space radiation environment are estimated.
  • Keywords
    SRAM chips; field programmable gate arrays; SRAM; Virtex-5 field programmable gate array; logic configuration; proton irradiation; single event upset characterization; space radiation environment; Field programmable gate arrays; Light emitting diodes; Performance evaluation; Protons; Radiation effects; Random access memory; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619490
  • Filename
    5619490
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817394