• DocumentCode
    2817458
  • Title

    Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

  • Author

    Bryan, Martha V O ; LaBel, Kenneth A. ; Pellish, Jonathan A. ; Chen, Dakai ; Lauenstein, Jean-Marie ; Marshall, Cheryl J. ; Ladbury, Ray L. ; Oldham, Timothy R. ; Kim, Hak S. ; Phan, Anthony M. ; Berg, Melanie D. ; Carts, Martin A. ; Sanders, Anthony B. ;

  • Author_Institution
    MEI Technol., Inc., Greenbelt, MD, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    12
  • Lastpage
    12
  • Abstract
    We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
  • Keywords
    radiation effects; space vehicle electronics; space vehicles; NASA; radiation effect; single event effect analysis; single event effect testing; spacecraft electronic; Atmospheric measurements; CMOS integrated circuits; Electronic mail; NASA; Particle measurements; Protons; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619494
  • Filename
    5619494
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817458