Title :
Current Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA
Author :
Bryan, Martha V O ; LaBel, Kenneth A. ; Pellish, Jonathan A. ; Chen, Dakai ; Lauenstein, Jean-Marie ; Marshall, Cheryl J. ; Ladbury, Ray L. ; Oldham, Timothy R. ; Kim, Hak S. ; Phan, Anthony M. ; Berg, Melanie D. ; Carts, Martin A. ; Sanders, Anthony B. ;
Author_Institution :
MEI Technol., Inc., Greenbelt, MD, USA
Abstract :
We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Keywords :
radiation effects; space vehicle electronics; space vehicles; NASA; radiation effect; single event effect analysis; single event effect testing; spacecraft electronic; Atmospheric measurements; CMOS integrated circuits; Electronic mail; NASA; Particle measurements; Protons; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619494
