• DocumentCode
    2817470
  • Title

    Compendium of Test Results of Recent Single Event Effect Tests Conducted by the Jet Propulsion Laboratory

  • Author

    McClure, Steven S. ; Allen, Gregory R. ; Irom, Farokh ; Scheick, Leif Z. ; Adell, Philippe C. ; Miyahira, Tetsuo F.

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    6
  • Lastpage
    6
  • Abstract
    This paper reports heavy ion and proton-induced single event effect (SEE) results from recent tests for a variety of microelectronic devices. The compendium covers devices tested over the last two years by the Jet Propulsion Laboratory.
  • Keywords
    integrated circuit testing; Jet Propulsion Laboratory; SEE test; heavy ion-induced single event effect; microelectronic devices; proton-induced single event effect; single event effect test; CMOS integrated circuits; CMOS technology; Performance evaluation; SDRAM; Single event upset; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619495
  • Filename
    5619495
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817470