DocumentCode :
2817499
Title :
MOVPE growth of GaNAs using tertiarybutylarsine (TBA) and dimethylhydrazine (DMHy)
Author :
Moto, Akihiro ; Tanaka, So ; Ikoma, Nobuyuki ; Tanabe, Tatsuya ; Takagishi, Shigenori ; Takahashi, Mitsuo ; Katsuyama, Tsukuru
Author_Institution :
Basic High-Technol. Labs., Sumitomo Electr. Ind. Ltd., Hyogo, Japan
fYear :
1998
fDate :
11-15 May 1998
Firstpage :
139
Lastpage :
142
Abstract :
GaNAs alloys were successfully grown on GaAs substrates by low-pressure MOVPE with all organometallic sources of triethylgallium (TEG), tertiarybutylarsine (TBA), and dimethylhydrazine (DMHy). We studied the incorporation behavior of nitrogen in terms of growth temperature and molar flow ratio of supplied sources. A ratio of TBA to the group III element, As/III, as low as 1.4 was found to be possible to grow GaNAs with good crystalline quality. Since the nitrogen concentration of more than 3% was easily achieved by our growth technique. The combination of TBA-DMHy as V precursors is a candidate for the growth of other III-V alloys containing nitrogen. We observed a decrease in PL intensity with enhancing nitrogen incorporation into solids: lowering growth temperature and increasing the fractional flow ratio of DMHy. In order to recover from degradation in optical properties, Rapid Thermal Annealing (RTA) was demonstrated and found to be effective. Therefore MOVPE using TBA-DMHy combined with post-annealing is expected to obtain GaNAs alloys with high nitrogen concentration as well as excellent optical properties
Keywords :
III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; photoluminescence; rapid thermal annealing; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; GaAs; GaAs substrates; GaNAs; crystalline quality; dimethylhydrazine; growth temperature; low-pressure MOVPE; molar flow ratio; nitrogen concentration; photoluminescence intensity; rapid thermal annealing; tertiarybutylarsine; triethylgallium; Crystallization; Epitaxial growth; Epitaxial layers; Gallium arsenide; III-V semiconductor materials; Nitrogen; Rapid thermal annealing; Solids; Temperature; Thermal degradation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location :
Tsukuba
ISSN :
1092-8669
Print_ISBN :
0-7803-4220-8
Type :
conf
DOI :
10.1109/ICIPRM.1998.712421
Filename :
712421
Link To Document :
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