Title :
Radiation Hardness Characterization of a 130nm ASIC Library Technology
Author :
Dumitru, Radu ; Hafer, Craig ; Wu, Tzu-Wen ; Rominger, Rob ; Gardner, Harry ; Millike, Peter ; Bruno, Kevin ; Farris, Teresa
Author_Institution :
Aeroflex Colorado Springs, Colorado Springs, CO, USA
Abstract :
Radiation hardness characterization has been performed on a RadHard-by-Design ASIC Library designed using a 130nm commercial fab process. Test chip results are presented illustrating the ASIC library performance and radiation hardness response.
Keywords :
application specific integrated circuits; integrated circuit design; integrated circuit testing; radiation hardening (electronics); RadHard-by-Design ASIC Library; chip testing; fab process; radiation hardness characterization; radiation hardness response; size 130 nm; wafer fabrication;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2010 IEEE
Conference_Location :
Denver, CO
Print_ISBN :
978-1-4244-8405-8
DOI :
10.1109/REDW.2010.5619510
