• DocumentCode
    2817844
  • Title

    Hardening of Texas Instruments´ VC33 DSP

  • Author

    Fuller, Robert ; Morris, Wesley ; Gifford, David ; Lowther, Rex ; Gwin, Jon ; Salzman, James ; Alexander, David ; Hunt, Ken

  • Author_Institution
    Silicon Space Technol., Austin, TX, USA
  • fYear
    2010
  • fDate
    20-23 July 2010
  • Firstpage
    5
  • Lastpage
    5
  • Abstract
    A hardened version of Texas Instruments´´ VC33 Digital Signal Processor was created without any mask changes. The commercial mask set was processed using Silicon Space Technology´´s HardSIL™ process variant to produce the hardened version. Radiation testing of the resulting hardened circuit demonstrated significant improvement in performance.
  • Keywords
    digital signal processing chips; hardening; integrated circuit testing; masks; radiation effects; DSP; HardSIL; Silicon Space Technology; Texas Instruments; VC33 digital signal processor; mask; radiation testing; Digital signal processing; Hardware; Instruments; Radiation hardening; Silicon; Software; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop (REDW), 2010 IEEE
  • Conference_Location
    Denver, CO
  • ISSN
    2154-0519
  • Print_ISBN
    978-1-4244-8405-8
  • Type

    conf

  • DOI
    10.1109/REDW.2010.5619513
  • Filename
    5619513
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2817844