DocumentCode
2817927
Title
Contact Conductance Quantization in a MEMS Switch
Author
Poulain, Christophe ; Jourdan, Guillaume ; Peschot, Alexis ; Mandrillon, Vincent
Author_Institution
Microsyst. Characterization & Reliability Lab., CEA-LETI-MINATEC, Grenoble, France
fYear
2010
fDate
4-7 Oct. 2010
Firstpage
1
Lastpage
7
Abstract
When the dimensions of a metallic conductor are much smaller than the mean free path of the electrons and become comparable to the Fermi wavelength, the absence of scattering results in ballistic electron transport and the conductance becomes quantized. In this paper we present original experiments carried out in air at room temperature on MEMS switches actuated by a nanoindenter apparatus. The current and voltage curve across contact electrodes were monitored and recorded continuously while opening the switch at an extremely low speed. Instead of a linear conductance curve, the presence of quantized conductance plateaus lasting up to hundreds of μs have been observed just before the separation of the two contact members. The conductance plateaus are close to integer multiples of the conductance quantum G0 = 2e2/h. These results are consistent with theoretical predictions for quantum ballistic transport in atomic-sized contacts and show that a quantum phenomenon can easily be observed in a basic MEMS switch under ambient conditions. The influence of the nature of the contact material and current as well as the deviation between the experimental results and exact values are reviewed and discussed.
Keywords
conductors (electric); microswitches; Fermi wavelength; MEMS switches; ballistic electron transport; contact conductance quantization; contact electrodes; linear conductance curve; metallic conductor; nanoindenter apparatus; quantum ballistic transport; Contacts; Gold; Histograms; Microswitches; Quantization; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
Conference_Location
Charleston, SC
ISSN
1062-6808
Print_ISBN
978-1-4244-8174-3
Type
conf
DOI
10.1109/HOLM.2010.5619518
Filename
5619518
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