Title :
Characterization Techniques for Nanostructured Contact Materials
Author_Institution :
MB Interface Inc., Montreal, QC, Canada
Abstract :
Testing methods that can be used for characterization of nanostructured contact materials, which result from many of the processing routes for preparation and evaluation of nanocrystalline materials, are reviewed.
Keywords :
electrical contacts; nanostructured materials; characterization technique; nanocrystalline material; nanostructured contact material; Force; Materials; Microscopy; Probes; Surface topography; Thermal conductivity; Tunneling;
Conference_Titel :
Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
Conference_Location :
Charleston, SC
Print_ISBN :
978-1-4244-8174-3
DOI :
10.1109/HOLM.2010.5619531
