• DocumentCode
    2818562
  • Title

    The Influence of Particulate Contaminants on Vibration-Induced Fretting Degradation in Electrical Connectors

  • Author

    Gao, Jinchun ; Chen, Chen ; Flowers, George T. ; Jackson, Robert L. ; Bozack, Michael J.

  • Author_Institution
    Lab. of Electr. Contacts, Beijing Univ. of Posts & Telecommun., Beijing, China
  • fYear
    2010
  • fDate
    4-7 Oct. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Fretting degradation has long been recognized as a major failure mechanism for electrical connector systems. In certain circumstances, such as for vehicle applications, connectors are exposed to exterior environments and could easily be infiltrated by dust and other particulate contaminants through the housing or during the mating process. The presence of particulate contaminants during vibration can aggravate abrasion and fretting of the connector interface, resulting in a dramatic increase in electrical resistance and failure of the connector contacts. In this work, the basic aggravation mechanisms of particulate contaminants has been experimentally studied and analyzed. A finite element model is developed in ABAQUS for a particular connector pair. A series of simulations were performed in order to evaluate the threshold vibration levels as a function of excitation frequency. Corresponding experiments were then conducted to validate and test the simulation.
  • Keywords
    electric connectors; electrical faults; finite element analysis; vibrations; ABAQUS; abrasion; connector contacts; connector interface; electrical connector systems; electrical connectors; electrical resistance; excitation frequency; failure mechanism; finite element model; mating process; particulate contaminants; threshold vibration levels; vehicle applications; vibration induced fretting degradation; Conferences; Connectors; Contacts; Degradation; Surface cleaning; Transfer functions; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on
  • Conference_Location
    Charleston, SC
  • ISSN
    1062-6808
  • Print_ISBN
    978-1-4244-8174-3
  • Type

    conf

  • DOI
    10.1109/HOLM.2010.5619554
  • Filename
    5619554