DocumentCode
2818689
Title
EXEQ II and III: On-board experiments for the study of single events
Author
Duzellier, S. ; Falguère, D. ; Ecoffet, R. ; Tsourilo, I.
Author_Institution
ONERA-CERT, Toulouse, France
fYear
1997
fDate
15-19 Sep 1997
Firstpage
504
Lastpage
509
Abstract
SEE Spaceflight measurements are presented on various SRAM and DRAM in the MIR station orbit. The results permitted the error mapping and the localisation of hazardous regions
Keywords
DRAM chips; SRAM chips; ion beam effects; space vehicle electronics; DRAM; EXEQ II; EXEQ III; MIR station orbit; SEE; SRAM; single event error; spaceflight measurement; Circuit testing; Content addressable storage; EPROM; Extraterrestrial measurements; Mars; Protons; Random access memory;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location
Cannes
Print_ISBN
0-7803-4071-X
Type
conf
DOI
10.1109/RADECS.1997.698985
Filename
698985
Link To Document