Title :
EXEQ II and III: On-board experiments for the study of single events
Author :
Duzellier, S. ; Falguère, D. ; Ecoffet, R. ; Tsourilo, I.
Author_Institution :
ONERA-CERT, Toulouse, France
Abstract :
SEE Spaceflight measurements are presented on various SRAM and DRAM in the MIR station orbit. The results permitted the error mapping and the localisation of hazardous regions
Keywords :
DRAM chips; SRAM chips; ion beam effects; space vehicle electronics; DRAM; EXEQ II; EXEQ III; MIR station orbit; SEE; SRAM; single event error; spaceflight measurement; Circuit testing; Content addressable storage; EPROM; Extraterrestrial measurements; Mars; Protons; Random access memory;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.698985
