Title :
Welcome message from general Co-chairs
Author :
Kuen-Jong Lee ; Cheng, Tim
Author_Institution :
National Cheng Kung University, Taiwan
Abstract :
The VLSI-DAT was spun off from the highly influential, 22-year-old, International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) in 2005. In six years, the VLSI-DAT has emerged into the most prominent international event on IC design, automation, and test held in Taiwan. Around 400 academic researchers and industry practitioners from all over the world attend VLSI-DAT each year. The 2010 VLSI-DAT features three keynote speeches:
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu, Taiwan
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
DOI :
10.1109/VDAT.2010.5496641
