DocumentCode :
2818960
Title :
Superior-Order Curvature-Corrected Voltage References Using Double Differential Structures
Author :
Popa, C.
Author_Institution :
Fac. of Electron., Telecommun. & Inf. Technol., Bucharest
Volume :
2
fYear :
2006
fDate :
25-28 May 2006
Firstpage :
65
Lastpage :
68
Abstract :
Two original superior-order curvature-corrected voltage references was presented. In order to improve the temperature behavior of the circuits, double differential structures was used, implementing the linear and the superior-order curvature corrections. An original CTAT (complementary to absolute temperature) voltage generator was proposed, using exclusively MOS transistors biased in weak inversion for a low power operation of the voltage reference. The superior-order curvature-correction was implemented by taking the difference between two gate-source voltages of subthreshold-operated MOS transistors, biased at drain currents having different temperature dependencies: PTAT (proportional to absolute temperature) and PTAT2. The SPICE simulations confirm the theoretical estimated results, showing temperature coefficients under 11 ppm/K for an extended input range 173K < T < 423K and for a supply voltage of 2.5V and a current consumption of about 1muA
Keywords :
MOSFET; SPICE; circuit simulation; reference circuits; SPICE simulation; circuit temperature behavior; complementary to absolute temperature voltage generator; double differential structure; gate-source voltage; proportional to absolute temperature; subthreshold-operated MOS transistor; superior-order curvature correction; superior-order curvature-corrected voltage reference; Bipolar transistors; CMOS technology; Circuits; MOS devices; MOSFETs; Photonic band gap; Temperature dependence; Temperature distribution; Temperature sensors; Threshold voltage; curvature-correction technique; double differential structure; second-order effects; temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation, Quality and Testing, Robotics, 2006 IEEE International Conference on
Conference_Location :
Cluj-Napoca
Print_ISBN :
1-4244-0360-X
Electronic_ISBN :
1-4244-0361-8
Type :
conf
DOI :
10.1109/AQTR.2006.254601
Filename :
4022924
Link To Document :
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