DocumentCode :
2819008
Title :
Improved selective area growth properties in metalorganic vapor phase epitaxy by adding HCl
Author :
Tsuchiya, T.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear :
1998
fDate :
11-15 May 1998
Firstpage :
325
Lastpage :
328
Abstract :
Selective area growth (SAG) of InP on a planar substrate by metalorganic vapor phase epitaxy (MOVPE) is an attractive way to integrate optical devices. To improve the growth mode of SAG, the author has added hydrogen chloride (HCl) to conventional MOVPE, and discusses the flatness, thickness enhancement ratio, and crystalline quality of Cl-assisted SAG
Keywords :
III-V semiconductors; MOCVD; indium compounds; integrated optics; semiconductor epitaxial layers; semiconductor growth; surface topography; vapour phase epitaxial growth; Cl-assisted SAG; HCl; InP; MOVPE; crystalline quality; flatness; growth mode; hydrogen chloride; integrated optical devices; metalorganic vapor phase epitaxy; planar substrate; selective area growth; thickness enhancement ratio; Epitaxial growth; Epitaxial layers; Gases; Human computer interaction; Hydrogen; Indium phosphide; Inductors; Scanning electron microscopy; Substrates; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1998 International Conference on
Conference_Location :
Tsukuba
ISSN :
1092-8669
Print_ISBN :
0-7803-4220-8
Type :
conf
DOI :
10.1109/ICIPRM.1998.712468
Filename :
712468
Link To Document :
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