DocumentCode
2819046
Title
A digital background calibration technique for pipelined ADC using redundant stages
Author
Yoo, Jaeki ; Lee, Edward ; Swartzlander, Earl E., Jr.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume
1
fYear
2003
fDate
27-30 Dec. 2003
Firstpage
5
Abstract
A new digital background calibration technique for pipelined analog-to-digital converter (ADC) is proposed in this paper. In this architecture, two redundant pipelined stages are added to the ADC that creates time slots for the pipelined stages such that calibration cycles can be scheduled to the pipeline stages during normal operations. Compared to other background calibration techniques, the proposed technique calibrates the gain errors, the offset errors and the nonlinearity errors of the ADC. It does not need to design dedicated separate ADCs or DACs for calibration. It also provides no degradations in performance for high frequency input signals and the complexity of the digital hardware is relatively simple.
Keywords
analogue-digital conversion; calibration; pipeline processing; switched capacitor networks; digital background calibration; gain errors; nonlinearity errors; offset errors; pipelined ADC; pipelined analog-to-digital converter; redundant pipelined stages; Analog-digital conversion; Calibration; Capacitors; Clocks; Computer architecture; Degradation; Frequency; Hardware; Linearity; Pipelines;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
ISSN
1548-3746
Print_ISBN
0-7803-8294-3
Type
conf
DOI
10.1109/MWSCAS.2003.1562205
Filename
1562205
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