DocumentCode :
2819046
Title :
A digital background calibration technique for pipelined ADC using redundant stages
Author :
Yoo, Jaeki ; Lee, Edward ; Swartzlander, Earl E., Jr.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume :
1
fYear :
2003
fDate :
27-30 Dec. 2003
Firstpage :
5
Abstract :
A new digital background calibration technique for pipelined analog-to-digital converter (ADC) is proposed in this paper. In this architecture, two redundant pipelined stages are added to the ADC that creates time slots for the pipelined stages such that calibration cycles can be scheduled to the pipeline stages during normal operations. Compared to other background calibration techniques, the proposed technique calibrates the gain errors, the offset errors and the nonlinearity errors of the ADC. It does not need to design dedicated separate ADCs or DACs for calibration. It also provides no degradations in performance for high frequency input signals and the complexity of the digital hardware is relatively simple.
Keywords :
analogue-digital conversion; calibration; pipeline processing; switched capacitor networks; digital background calibration; gain errors; nonlinearity errors; offset errors; pipelined ADC; pipelined analog-to-digital converter; redundant pipelined stages; Analog-digital conversion; Calibration; Capacitors; Clocks; Computer architecture; Degradation; Frequency; Hardware; Linearity; Pipelines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
ISSN :
1548-3746
Print_ISBN :
0-7803-8294-3
Type :
conf
DOI :
10.1109/MWSCAS.2003.1562205
Filename :
1562205
Link To Document :
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