Title :
IEE Colloquium on `Sub-Micron Silicon Engineering´ (Digest No.74)
Abstract :
The following topics were dealt with: bipolar technology; gate arrays; CMOS; SOS; device noise; MOSFETs
Keywords :
electron device noise; monolithic integrated circuits; semiconductor devices; semiconductor technology; CMOS; MOSFETs; SOS; bipolar technology; device noise; gate arrays;
Conference_Titel :
Sub-Micron Silicon Engineering, IEE Colloquium on
Conference_Location :
London
