• DocumentCode
    2819433
  • Title

    Ising field parameter estimation from incomplete and noisy data

  • Author

    Giovannelli, J.-F.

  • Author_Institution
    Lab. de l´´Integration du Materiau au Syst., Univ. de Bordeaux, Talence, France
  • fYear
    2011
  • fDate
    11-14 Sept. 2011
  • Firstpage
    1853
  • Lastpage
    1856
  • Abstract
    The present paper deals with the estimation problem of the Ising field parameter and extends a previous one [1]. It proposes an estimate from indirect observation (incomplete and noisy), whereas the previous paper proposed an estimate from direct observation (complete and noiseless). Both of them are based on an explicit expression for the partition function, known for a long time [2] but, to the best of our knowledge, never used for parameter estimation (except in our previous paper [1]). Both of them are developed in a Bayesian framework. In our previous study (direct observation), the posterior law is explicit but in the present case (indirect observation) the posterior law is not explicit due to the hidden structure. The proposed approach relies on a full Bayesian strategy and a stochastic sampling algorithm (Gibbs sampler including a Metropolis-Hastings step) for posterior exploration. The paper proposes a numerical evaluation of the proposed method.
  • Keywords
    Bayes methods; Ising model; functions; image sampling; maximum likelihood estimation; stochastic processes; Bayesian framework; Gibbs sampler; Ising field parameter estimation; Metropolis-Hastings step; incomplete data; noisy data; numerical evaluation; partition function; posterior law; stochastic sampling algorithm; Bayesian methods; Histograms; Image reconstruction; Joints; Markov processes; Parameter estimation; Bayesian; Ising field; hidden variable; incomplete data; parameter estimation; partition function;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2011 18th IEEE International Conference on
  • Conference_Location
    Brussels
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4577-1304-0
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2011.6115827
  • Filename
    6115827