• DocumentCode
    2819577
  • Title

    One-dimensional analytical modeling of the VDMOS transistor taking into account the thermoelectrical interactions

  • Author

    Lallement, C. ; Bouchakour, R. ; Maurel, T.

  • Author_Institution
    Dept. d´´Electronique, Telecom Paris, France
  • Volume
    1
  • fYear
    1994
  • fDate
    3-5 Aug 1994
  • Firstpage
    682
  • Abstract
    We have developed an analytical one-dimensional thermoelectrical model for the power MOSFET transistor, implemented in the SABER circuits simulator, in which the device´s temperature becomes an interactive variable during the simulation. The accuracy of the model is improved with an electrical and thermal characterization, and two validation circuits
  • Keywords
    circuit analysis computing; digital simulation; power MOSFET; semiconductor device models; transient analysis; SABER circuits simulator; VDMOS transistor; electrical characterization; interactive variable; one-dimensional analytical modeling; power MOSFET transistor; thermal characterization; thermoelectrical interactions; validation circuits; Analytical models; Circuit simulation; Electronic packaging thermal management; Impedance; Power MOSFET; Resistance heating; Temperature dependence; Temperature sensors; Thermoelectric devices; Thermoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994., Proceedings of the 37th Midwest Symposium on
  • Conference_Location
    Lafayette, LA
  • Print_ISBN
    0-7803-2428-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1994.519385
  • Filename
    519385