• DocumentCode
    2819790
  • Title

    Advanced Full Periphery pHEMT Switch with Optimum Figure of Merit Ron*Coff

  • Author

    Yuan, Cheng-Guan ; Liu, S. M Joseph ; Takatani, Shinichiro ; Sun, Jean

  • Author_Institution
    WIN Semicond. Corp., Tao Yuan Shien, Taiwan
  • fYear
    2010
  • fDate
    3-6 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A low cost, high yield, superior performance pseudomorphic high electron mobility transistor (pHEMT) technology is developed for handset switch application. This technology adopts a novel FET unit cell together with an optimized epi structure. The FET unit cell adopts the full periphery design to reduce FET footprint and improve isolation without increasing on-resistance (Ron). The optimization of epi structure can greatly reduce the Ron of this technology. The Ron is successfully reduced from 1.9 to 1.3 Ohm.mm for a 5×125μm single-gate device. Thus, this new device enables us not only to have lower insertion loss, but also to further reduce FET unit cell size. Therefore, the cost for the antenna switches is drastically reduced.
  • Keywords
    high electron mobility transistors; switches; FET unit cell; advanced full periphery pHEMT switch; handset switch application; on-resistance; optimized epi structure; pseudomorphic high electron mobility transistor; Fingers; Harmonic analysis; Insertion loss; Logic gates; PHEMTs; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductor Integrated Circuit Symposium (CSICS), 2010 IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1550-8781
  • Print_ISBN
    978-1-4244-7437-0
  • Electronic_ISBN
    1550-8781
  • Type

    conf

  • DOI
    10.1109/CSICS.2010.5619631
  • Filename
    5619631