• DocumentCode
    2820065
  • Title

    Traffic-thermal mutual-coupling co-simulation platform for three-dimensional Network-on-Chip

  • Author

    Jheng, Kai-Yuan ; Chao, Chih-Hao ; Wang, Hao-Yu ; Wu, An-Yeu

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2010
  • fDate
    26-29 April 2010
  • Firstpage
    135
  • Lastpage
    138
  • Abstract
    Thermal issue is one of the major challenges in the research field of three-dimensional (3D) IC. Network-on-Chip (NoC) has been viewed as a practical communication infrastructure for 3D IC. To facilitate such research, an accurate and non-proprietary environment for simulating the NoC traffic and temperature is necessary. In this paper, we present a traffic-thermal mutual-coupling co-simulation platform for 3D NoC. The translation error is eliminated, and therefore our co-simulation has no accuracy loss on mutual coupling. Our simulation results, validated with a commercial tool, show the temperature error of our platform is between -1 and 4 K. The simulation results also show the thermal profile of 3D NoC, in which the temperature is imbalance even under the balanced traffic. Hence, the proposed platform can be used for 3D thermal-aware design, 3D dynamic thermal management technology, and other related researches in the future.
  • Keywords
    integrated circuit design; network-on-chip; thermal management (packaging); three-dimensional integrated circuits; 3D IC; 3D NoC; 3D dynamic thermal management technology; 3D thermal-aware design; NoC traffic; balanced traffic; communication infrastructure; mutual coupling; temperature -1 K to 4 K; thermal issue; thermal profile; three-dimensional IC; three-dimensional network-on-chip; traffic-thermal mutual-coupling co-simulation platform; translation error; Energy management; Mutual coupling; Network-on-a-chip; Power system modeling; Technology management; Telecommunication traffic; Temperature; Thermal management; Three-dimensional integrated circuits; Traffic control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
  • Conference_Location
    Hsin Chu
  • Print_ISBN
    978-1-4244-5269-9
  • Electronic_ISBN
    978-1-4244-5271-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2010.5496709
  • Filename
    5496709