DocumentCode
2820065
Title
Traffic-thermal mutual-coupling co-simulation platform for three-dimensional Network-on-Chip
Author
Jheng, Kai-Yuan ; Chao, Chih-Hao ; Wang, Hao-Yu ; Wu, An-Yeu
Author_Institution
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear
2010
fDate
26-29 April 2010
Firstpage
135
Lastpage
138
Abstract
Thermal issue is one of the major challenges in the research field of three-dimensional (3D) IC. Network-on-Chip (NoC) has been viewed as a practical communication infrastructure for 3D IC. To facilitate such research, an accurate and non-proprietary environment for simulating the NoC traffic and temperature is necessary. In this paper, we present a traffic-thermal mutual-coupling co-simulation platform for 3D NoC. The translation error is eliminated, and therefore our co-simulation has no accuracy loss on mutual coupling. Our simulation results, validated with a commercial tool, show the temperature error of our platform is between -1 and 4 K. The simulation results also show the thermal profile of 3D NoC, in which the temperature is imbalance even under the balanced traffic. Hence, the proposed platform can be used for 3D thermal-aware design, 3D dynamic thermal management technology, and other related researches in the future.
Keywords
integrated circuit design; network-on-chip; thermal management (packaging); three-dimensional integrated circuits; 3D IC; 3D NoC; 3D dynamic thermal management technology; 3D thermal-aware design; NoC traffic; balanced traffic; communication infrastructure; mutual coupling; temperature -1 K to 4 K; thermal issue; thermal profile; three-dimensional IC; three-dimensional network-on-chip; traffic-thermal mutual-coupling co-simulation platform; translation error; Energy management; Mutual coupling; Network-on-a-chip; Power system modeling; Technology management; Telecommunication traffic; Temperature; Thermal management; Three-dimensional integrated circuits; Traffic control;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location
Hsin Chu
Print_ISBN
978-1-4244-5269-9
Electronic_ISBN
978-1-4244-5271-2
Type
conf
DOI
10.1109/VDAT.2010.5496709
Filename
5496709
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