DocumentCode
2820229
Title
A prototype unit for built-in self-test of analog circuits
Author
Lewis, Brandon ; Lim, Sheac ; Puckett, Robert ; Stroud, Charles
Author_Institution
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
fYear
1999
fDate
1999
Firstpage
221
Lastpage
224
Abstract
The design, implementation, and operation of a prototype assembly used to evaluate and demonstrate a mixed-signal based built-in self-test approach for analog circuits is described. Experimental results obtained from testing benchmark circuits using the prototype assembly are presented to illustrate results that cannot be easily obtained from a simulation environment
Keywords
automatic testing; built-in self test; circuit simulation; integrated circuit testing; mixed analogue-digital integrated circuits; analog circuits; benchmark circuits; built-in self-test; mixed-signal circuits; prototype assembly; simulation environment; Analog circuits; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computer architecture; Electrical fault detection; Prototypes; Software prototyping; Virtual prototyping;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon '99. Proceedings. IEEE
Conference_Location
Lexington, KY
Print_ISBN
0-7803-5237-8
Type
conf
DOI
10.1109/SECON.1999.766128
Filename
766128
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