Title :
A prototype unit for built-in self-test of analog circuits
Author :
Lewis, Brandon ; Lim, Sheac ; Puckett, Robert ; Stroud, Charles
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
The design, implementation, and operation of a prototype assembly used to evaluate and demonstrate a mixed-signal based built-in self-test approach for analog circuits is described. Experimental results obtained from testing benchmark circuits using the prototype assembly are presented to illustrate results that cannot be easily obtained from a simulation environment
Keywords :
automatic testing; built-in self test; circuit simulation; integrated circuit testing; mixed analogue-digital integrated circuits; analog circuits; benchmark circuits; built-in self-test; mixed-signal circuits; prototype assembly; simulation environment; Analog circuits; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computer architecture; Electrical fault detection; Prototypes; Software prototyping; Virtual prototyping;
Conference_Titel :
Southeastcon '99. Proceedings. IEEE
Conference_Location :
Lexington, KY
Print_ISBN :
0-7803-5237-8
DOI :
10.1109/SECON.1999.766128
