Title :
Built-in self-test for analog circuits in mixed-signal systems
Author :
Maggard, Kristi ; Stroud, Charles
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Abstract :
A built-in self-test (BIST) approach is presented which is designed to test the analog portion of mixed-signal systems. The BIST approach is evaluated using fault simulation with analog benchmark circuits and is found to consistently provide high fault coverage of all stuck-open and stuck-short faults in the circuit under test
Keywords :
automatic testing; built-in self test; circuit simulation; fault simulation; mixed analogue-digital integrated circuits; analog circuits; benchmark circuits; built-in self-test; fault coverage; fault simulation; mixed-signal systems; stuck-open faults; stuck-short faults; Analog circuits; Benchmark testing; Built-in self-test; Circuit faults; Circuit noise; Circuit simulation; Circuit testing; Control systems; Electrical fault detection; System testing;
Conference_Titel :
Southeastcon '99. Proceedings. IEEE
Conference_Location :
Lexington, KY
Print_ISBN :
0-7803-5237-8
DOI :
10.1109/SECON.1999.766129
