Title :
Predicting multi-core system Fmax by data-learning methodology
Author :
Chen, Janine ; Zeng, Jing ; Wang, Li.-C. ; Mateja, Michael ; Rearick, Jeff
Author_Institution :
Dept. of ECE, UC-Santa Barbara, Santa Barbara, CA, USA
Abstract :
The use of low-cost structural Fmax measurement as a replacement for in-system Fmax measurement for speed binning has been aided by the use of a data-learning approach that can be used to build a reliable single-core system Fmax predictor given structural Fmax. This paper uses industry test measurements to demonstrate how the data-learning approach can be applied to predict multi-core system Fmax, how to use the information of each core to achieve better prediction, and how the proposed methodology works on multiple lots.
Keywords :
integrated circuit testing; microprocessor chips; data-learning methodology; industry test measurements; multicore system prediction; multiple lots; single-core system Fmax predictor; speed binning; structural Fmax measurement; Buildings; Correlation; Engines; Fluid flow measurement; Gaussian processes; Microprocessors; Power measurement; Production; System testing; Velocity measurement;
Conference_Titel :
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location :
Hsin Chu
Print_ISBN :
978-1-4244-5269-9
Electronic_ISBN :
978-1-4244-5271-2
DOI :
10.1109/VDAT.2010.5496729