DocumentCode
2820702
Title
A temperature-aware global router
Author
Lee, Yu-Ting ; Chang, Yen-Jung ; Ting-Chi Wang
Author_Institution
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2010
fDate
26-29 April 2010
Firstpage
279
Lastpage
282
Abstract
In this paper, we present a temperature-aware global router that considers the reliability of interconnects by improving a state-of-the-art global router, NTHU-Route 2.0, with the following enhancements: (1) a temperature-aware L-shaped routing method employed during initial routing, (2) two temperature-aware cost functions employed during rip-up and reroute, and (3) three implementation techniques for memory reduction. The experimental results show that under two different types of thermal profiles our router solves 12 of 16 ISPD08 benchmarks without causing any overflow, which is as good as NTHU-Route 2.0. For the other 4 benchmarks, our router can generate results with comparable overflows. Furthermore, our router significantly reduces the number of net segments located in hot spots and thus enhances the chip reliability. Finally, our router averagely reduces 45% memory usage of NTHU-Route 2.0.
Keywords
VLSI; integrated circuit interconnections; integrated circuit reliability; network routing; ISPD08 benchmarks; L-shaped routing; NTHU-Route 2.0; chip reliability; interconnect reliability; memory reduction; memory usage; temperature-aware global router; thermal profiles; Computer science; Cost function; Delay; Integrated circuit interconnections; Pins; Routing; Temperature; Tiles; Transistors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location
Hsin Chu
Print_ISBN
978-1-4244-5269-9
Electronic_ISBN
978-1-4244-5271-2
Type
conf
DOI
10.1109/VDAT.2010.5496743
Filename
5496743
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