• DocumentCode
    2820702
  • Title

    A temperature-aware global router

  • Author

    Lee, Yu-Ting ; Chang, Yen-Jung ; Ting-Chi Wang

  • Author_Institution
    Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    26-29 April 2010
  • Firstpage
    279
  • Lastpage
    282
  • Abstract
    In this paper, we present a temperature-aware global router that considers the reliability of interconnects by improving a state-of-the-art global router, NTHU-Route 2.0, with the following enhancements: (1) a temperature-aware L-shaped routing method employed during initial routing, (2) two temperature-aware cost functions employed during rip-up and reroute, and (3) three implementation techniques for memory reduction. The experimental results show that under two different types of thermal profiles our router solves 12 of 16 ISPD08 benchmarks without causing any overflow, which is as good as NTHU-Route 2.0. For the other 4 benchmarks, our router can generate results with comparable overflows. Furthermore, our router significantly reduces the number of net segments located in hot spots and thus enhances the chip reliability. Finally, our router averagely reduces 45% memory usage of NTHU-Route 2.0.
  • Keywords
    VLSI; integrated circuit interconnections; integrated circuit reliability; network routing; ISPD08 benchmarks; L-shaped routing; NTHU-Route 2.0; chip reliability; interconnect reliability; memory reduction; memory usage; temperature-aware global router; thermal profiles; Computer science; Cost function; Delay; Integrated circuit interconnections; Pins; Routing; Temperature; Tiles; Transistors; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
  • Conference_Location
    Hsin Chu
  • Print_ISBN
    978-1-4244-5269-9
  • Electronic_ISBN
    978-1-4244-5271-2
  • Type

    conf

  • DOI
    10.1109/VDAT.2010.5496743
  • Filename
    5496743