DocumentCode
2821004
Title
Authors index
fYear
2010
fDate
26-29 April 2010
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design Automation and Test (VLSI-DAT), 2010 International Symposium on
Conference_Location
Hsin Chu
Print_ISBN
978-1-4244-5269-9
Electronic_ISBN
978-1-4244-5271-2
Type
conf
DOI
10.1109/VDAT.2010.5496764
Filename
5496764
Link To Document